Summary
Interfacial structure plays a dominant role in physical properties of the oxides and their film. In this study, SrRuO3/Ba(Zr0.3Ti0.7)O-3/FeMn/Ba(Zr0.3Ti0.7)O-3/n-Si heterostructure was fabricated by utilizing pulsed laser deposition technique. The X-ray diffraction was utilized to analyze the multilayers' crystalline. Dielectric properties of the heterostructure were studied under various magnetic fields. Giant magnetocapacitance characteristic was gained from the heterostructure. It is found that the interfacial polarization between barium zirconate titanate film and iron manganese alloy film is responsible for giant magnetocapacitance. A possible dielectric polarization mechanism was investigated. This work can provide guidance for the development of the multi-functional memory device.
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Institution桂林理工大学