A new lock-in amplifier-based deep-level transient spectroscopy test and measurement system for solar cells

Authors：Jia, Yun; Ding, Xiaolei; Wang, Rui; Wang, Youyang; Zheng, Shiqi; Hu, Xiaobo^*; Weng, Guoen; Chen, Shaoqiang^*; Sakurai, Takeaki; Akiyama, Hidefumi

Source：Solar Energy, 2022, 244: 507-515.

DOI：10.1016/j.solener.2022.08.062

• DLTS system
• Deep level defects
• Solar cells
• Sb2S3
• CIGS

A new, widely-used, lock-in amplifier-based deep-level transient spectroscopy (DLTS) test and measurement system has been developed that efficiently digitizes and analyzes through conventional DLTS methods. The fundamental principle of DLTS, using the n(+)p diode, is introduced first. Part of the DLTS system setup is discussed in terms of the accuracy, optimization, and processing of measurement results. The established system is subsequently applied to study deep-level traps in the antimony sulfide (Sb2S3) and the Copper Indium Gallium Selenium (CIGS) thin-film solar cell. One electron trap and one hole trap were found in each of the two solar cells, and the calculated results are within a reasonable range compared with previous reports. It is shown experimentally that the DLTS system can be employed in a variety of test scenarios and the results are fundamentally in agreement with the mainstream system performance.

• Institution
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