Unveiling the degraded electron durability in reduced-dimensional perovskites

作者：Lu, Yu; Shen, Yang^*; Li, Yan-Qing^*; Shen, Kong-Chao; Zhou, Wei; Tang, Jian-Xin^*

来源：Nanoscale, 2023, 15(6): 2798-2805.

DOI：10.1039/d2nr06635a

• LEAD IODIDE PEROVSKITE
• DEGRADATION
• MIGRATION

The operational stability of reduced-dimensional metal halide perovskites (RD-MHPs) lags far behind the practical requirements for future high-definition displays. Thereinto, the electron durability of RD-MHPs plays a critical role in stable LEDs during continuous operation, however, it still lacks adequate research and a deep understanding. Herein, the electron durability and deterioration mechanism of phenethylammonium (PEA(+))-modified RD-MHPs are systematically conducted through an in situ photoelectron spectroscopy technique by implementing tunable electron-beam radiation to simulate device operation. The formation of detrimental metallic lead (Pb-0) caused by the reduction of lead ions (Pb2+) is observed along with the decomposition of PEA(+) under electron-beam radiation, thereby changing the photophysical properties of PEA(+)-doped RD-MHPs. These results provide deep insight into the process of how injected electrons affect the performance of PEA(+)-doped perovskite LEDs, which may also provide potential guidance for designing robust and effective organic spacers for RD-MHPs.

• 单位
  苏州大学; y