科研之友
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摘要
Due to the simplicity and low cost of attribute inspection, several control charts have been proposed for employing attribute inspection to monitor the mean shifts. But these charts usually require a larger sample size to perform well as the (X) over bar chart. In this paper, a new np(CEV) chart is proposed to monitor process mean shifts based on attribute inspection in which the conditional expected value (CEV) weight method is adopted to take full advantage of the censored observations obtained from attribute inspection. The optimal design of the proposed chart is derived from optimizing average run length (ARL) properties. Several numerical experiments are conducted to investigate the performance of the proposed chart. The results demonstrate that the proposed chart is always superior to np(x) chart by reducing the sample size by 70% to 97% while achieving the same ARL as np(x) chart. In addition, the proposed chart always achieves a smaller ARL(1) than (X) over bar (rec) chart. Furthermore, the proposed chart outperforms (X) over bar chart as it achieves the same ARL as that of (X ) over bar chart with a lower inspection cost. Finally, an industry example is given to illustrate how to simply apply the proposed chart to the manufacturing process.
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单位广东工业大学
