Data-driven responsive test technique for new generation launch vehicle

摘要

A kind of data-driven responsive test technique is presented in this paper. The data are sampled by using the on-board system based on built in test (BIT) technique, and sent to a ground system through high speed data bus; the evaluation procedure as the playback of the on-board processing is triggered by using these data with the same model and algorithm in the ground data processing terminal. The calculation results of the on-board system and the ground system are compared to detect and isolate failures quickly. Both background and necessity of the technique are reviewed, and a rather comprehensive introduction is provided for the implementation of each part of the design including selection of the monitoring spot, bus interception technique and data management task. Moreover, the principle of data evaluation for various representative signals and the means for fault detectectionand isolation are illustrated. The analysis is real-time, automatically, and can adapt the test cases adjustment, which is beneficial to system-level test coverage, thus decreasing test equipment, time for data analysis and engineers involved in technical support.

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